{"id":15779,"date":"2021-03-04T13:40:57","date_gmt":"2021-03-04T12:40:57","guid":{"rendered":"http:\/\/www.ntf.uni-lj.si\/toi\/?page_id=15779"},"modified":"2021-03-04T13:40:57","modified_gmt":"2021-03-04T12:40:57","slug":"sem-and-dma-l-314","status":"publish","type":"page","link":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/","title":{"rendered":"SEM and DMA (L-314)"},"content":{"rendered":"<div class='my-vrview' id='vrview1'><\/div>\n<p><script type='text\/javascript'>\twindow.addEventListener('load', onVrViewLoad1);function onVrViewLoad1() {var vrView = new VRView.Player('#vrview1', {image: 'https:\/\/www.ntf.uni-lj.si\/toi\/wp-content\/uploads\/sites\/7\/2021\/03\/2020_360prostori_toi_L314.jpg',is_stereo: false,width: '100%',height: '400' });}\n\t\t<\/script><\/p>\n<div id=\"tw-target-text-container\" class=\"tw-ta-container hide-focus-ring tw-nfl\">\n<p id=\"tw-target-text\" class=\"tw-data-text tw-text-large XcVN5d tw-ta\" dir=\"ltr\"><span lang=\"en\">Two apparatus are situated in the room:<\/span><\/p>\n<ul>\n<li class=\"tw-data-text tw-text-large XcVN5d tw-ta\"><span lang=\"en\">\u00a0scanning electron microscope SEM JSM-6060 LV (Jeol, Japan) <\/span><\/li>\n<li><span lang=\"en\">dynamic mechanical analyser\u00a0DMA Q800 (TA Instruments, USA) <\/span><\/li>\n<\/ul>\n<p>The SEM instrument is designed for surface, morphology and topography studies as well as for determination of particle size. <span lang=\"en\">The instrument is also accompanied by a <span class=\"aCOpRe\">automated sputter coater for fine grained gold coating on samplef of <\/span>non-conductive materials. You can find more about the device <a href=\"https:\/\/www.ntf.uni-lj.si\/ntf\/en\/research\/research-work\/research-equipment\/\">here<\/a>.<\/span><\/div>\n<div class=\"tw-ta-container hide-focus-ring tw-nfl\"><\/div>\n<div class=\"tw-ta-container hide-focus-ring tw-nfl\"><span lang=\"en\">The DMA instrument is intended for measuring a viscoelastic properties of various materials (measurements of Tg and secondary transitions, effect of frequency on modulus and Tg, effect of fillings, additives and adhesives, influence of technological processes, stabilities of dimensions, creep, relaxation tension, thermal mechanics, prediction of material response in a wide frequency range and time). You can find more about the device <a href=\"https:\/\/www.ntf.uni-lj.si\/ntf\/en\/research\/research-work\/research-equipment\/\">here<\/a>.<\/span><\/div>\n<div id=\"tw-target-rmn-container\" class=\"tw-ta-container hide-focus-ring tw-nfl\">\n<p id=\"tw-target-rmn\" class=\"tw-data-placeholder tw-text-small tw-ta\" dir=\"ltr\">\n<\/div>\n","protected":false},"excerpt":{"rendered":"Two apparatus are situated in the room: \u00a0scanning electron microscope SEM JSM-6060 LV (Jeol, Japan) dynamic mechanical analyser\u00a0DMA Q800 (TA Instruments, USA) The SEM instrument is designed for surface, morphology and topography studies as well as for determination of particle size. The instrument is also accompanied by a automated sputter coater for fine grained gold &#8230; <a class=\"view-article\" href=\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/\">Read more<\/a>","protected":false},"author":51,"featured_media":0,"parent":6593,"menu_order":314,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v17.0 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"SEM and DMA (L-314) - TOI\" \/>\n<meta property=\"og:description\" content=\"Two apparatus are situated in the room: \u00a0scanning electron microscope SEM JSM-6060 LV (Jeol, Japan) dynamic mechanical analyser\u00a0DMA Q800 (TA Instruments, USA) The SEM instrument is designed for surface, morphology and topography studies as well as for determination of particle size. The instrument is also accompanied by a automated sputter coater for fine grained gold ... Read more\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/\" \/>\n<meta property=\"og:site_name\" content=\"TOI\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.ntf.uni-lj.si\/toi\/#website\",\"url\":\"https:\/\/www.ntf.uni-lj.si\/toi\/\",\"name\":\"TOI\",\"description\":\"Katedra za tekstilno in obla\\u010dilno in\\u017eenirstvo\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.ntf.uni-lj.si\/toi\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#webpage\",\"url\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/\",\"name\":\"SEM and DMA (L-314) - TOI\",\"isPartOf\":{\"@id\":\"https:\/\/www.ntf.uni-lj.si\/toi\/#website\"},\"datePublished\":\"2021-03-04T12:40:57+00:00\",\"dateModified\":\"2021-03-04T12:40:57+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Domov\",\"item\":\"https:\/\/www.ntf.uni-lj.si\/toi\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"About\",\"item\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Facilities\",\"item\":\"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/\"},{\"@type\":\"ListItem\",\"position\":4,\"name\":\"SEM and DMA (L-314)\"}]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/","og_locale":"en_US","og_type":"article","og_title":"SEM and DMA (L-314) - TOI","og_description":"Two apparatus are situated in the room: \u00a0scanning electron microscope SEM JSM-6060 LV (Jeol, Japan) dynamic mechanical analyser\u00a0DMA Q800 (TA Instruments, USA) The SEM instrument is designed for surface, morphology and topography studies as well as for determination of particle size. The instrument is also accompanied by a automated sputter coater for fine grained gold ... Read more","og_url":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/","og_site_name":"TOI","twitter_misc":{"Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebSite","@id":"https:\/\/www.ntf.uni-lj.si\/toi\/#website","url":"https:\/\/www.ntf.uni-lj.si\/toi\/","name":"TOI","description":"Katedra za tekstilno in obla\u010dilno in\u017eenirstvo","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.ntf.uni-lj.si\/toi\/?s={search_term_string}"},"query-input":"required name=search_term_string"}],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#webpage","url":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/","name":"SEM and DMA (L-314) - TOI","isPartOf":{"@id":"https:\/\/www.ntf.uni-lj.si\/toi\/#website"},"datePublished":"2021-03-04T12:40:57+00:00","dateModified":"2021-03-04T12:40:57+00:00","breadcrumb":{"@id":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/sem-and-dma-l-314\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Domov","item":"https:\/\/www.ntf.uni-lj.si\/toi\/"},{"@type":"ListItem","position":2,"name":"About","item":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/"},{"@type":"ListItem","position":3,"name":"Facilities","item":"https:\/\/www.ntf.uni-lj.si\/toi\/en\/about\/facilities\/"},{"@type":"ListItem","position":4,"name":"SEM and DMA (L-314)"}]}]}},"_links":{"self":[{"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/pages\/15779"}],"collection":[{"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/users\/51"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/comments?post=15779"}],"version-history":[{"count":1,"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/pages\/15779\/revisions"}],"predecessor-version":[{"id":15780,"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/pages\/15779\/revisions\/15780"}],"up":[{"embeddable":true,"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/pages\/6593"}],"wp:attachment":[{"href":"https:\/\/www.ntf.uni-lj.si\/toi\/wp-json\/wp\/v2\/media?parent=15779"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}