Materialographic Practicum

General description:

The course covers and introduces non-destructive methods for material testing. The student acquires fundamental knowledge of the specific physical and chemical properties necessary for identifying and defining structural elements and components in metallic and non-metallic materials at the nano-, micro-, and macro-levels using non-destructive methods. They become acquainted with methods suitable for the practical analysis of structure and micro-chemical composition, and are trained for independent work and the appropriate selection of analytical methods based on specific tasks in material characterization. They master the skills of sample preparation and analysis using light microscopy, electron microanalysis, and microanalysis, and are actively introduced to methods for surface analysis.

Objectives and competences:

Objectives: To upgrade the knowledge of the structure and its impact on the properties of metals and alloys and other materials. Knowing the basic concepts of the constitution of alloys and criteria of occurrence of certain alloying systems for non- metallic materials and meeting the basic sample preparation procedures. Acquire knowledge and understanding of the typical methods from the field of characterization materials in general.

Competencies: ability to read phase diagrams, which enables the understanding and interpretation of the observed microstructure and the constitution of the material in general. Expert knowledge of the physical background of the research methods. For computational and laboratory work to develop the skills of critical evaluation of addressed phenomena in metals and alloys, as well as other materials, and independently perform laboratory work. Students get the ability to select appropriate investigative methods.

Knowledge and understanding:

Declarative: knowledge and understanding of the rules of mixing of metals and alloy formation system in conjunction with the process of solidification of metallic materials. Knowledge of basic microstructural features typical representatives of technical alloys, which is transferrable on the characteristics of other non-metallic materials.

Content (Syllabus outline):

Light microscopy. Preparation of samples and detection of microstructure. Chemical and physical methods for detection of microstructure and contrasting researched area. Preparation processes interfering layers of samples and their use in materiallography. Ambulant metallography. Optical contrasting procedures. Apparatus and methods for representation. Light-matter interaction. Construction of a light microscope to observe the reflected light. Quantitative materiallography and stereology; elements and definitions for quantitative description of the microstructure, basic parameters, the possibility of data collection, sample preparation, evaluation procedures.

Electron microscopy and microanalysis. Sample preparation: potentiostatic method, ion depletion, production cross-sections (cross-sectioning), the use of focused ion beam (FIB), a mechanical device (tripod). The interaction of electrons with the substance: inelastic and elastic scattering of electrons, the emission of X-rays. Spectrometers and detectors. The design and characteristics of analytical instruments: resolution transmission (TEM and HREM) and scanning (SEM) electron microscope, electronic microanalyzer (EDXS) tunneling microscope. Basics of synchrotron and the possibilities of research materials.

X-ray crystallographic devices. Preparation of the samples. Interpretation of analytical data RTG. Interpretation of electronic and X-ray diffraction data. Fundamentals of the theory of diffraction contrast: analysis and interpretation of resolution transmission electron micrograph images. Microanalysis and spectroscopic energy losses of electrons. Comparison of resolution and sensitivity of the methods and typical examples.

Methods for the analysis of the surface. Investigation of topography and physical properties of surfaces with atomic force microscope (AFM). Physico-chemical basis of methods for the analysis of surfaces: AES, XPS, SIMS, ISS. The interaction of electron and ion beam with the solid. Comparison of methods for surface analysis by electron probe microanalysis. The analyzed thickness, lateral and depth resolution. Types of tests: point, line and profile analysis, and image surfaces at your Best AES. Profile analysis using the methods of surface analysis, in combination with ion etching. Optimizing the parameters of ion etching. Qualitative and quantitative analysis of AES, XPS and SIMS: sensitivity factor method, standard, manual standard spectra. Using methods for the analysis of surfaces by oxidation, surface diffusion, segregation reaction, phase boundaries and multilayer structures.

The constitution and physical-metallurgical base selected alloy systems and metal materials. Iron, copper, aluminum and special alloys. Physico-metallurgical phenomena in alloys and research practicum. Observing the structure of metallic and ceramic materials, in particular materials with special properties, such as magnetic, semiconductor, etc.

Learning and teaching methods:

Lectures, seminars, research seminars, laboratory exercises, simulations, occurs.

Grading system:

Oral / written  exam – 50 %.

Seminar – 20 %.

Written laboratory report – 30 %.

Credit evaluation is also possible of individual (verifiable) study achievements. The course ends with an exam.