Microscopy of materials

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Goals: acquiring experimental methods for microscopic examination of materials. The following methods will be presented: scanning electron microscope (SEM) and microanalysis, transmission electron microscope (TEM), surface methods – scanning tunnelling microscope (STM), atomic force microscopy (AFM), low-energy electron diffraction (LEED) and Auger emission spectroscopy (AES).

Materials Science and Engineering (DR)

LevelYearSemesterETCS
3115

Hours

LecturesSeminarsPractiseOtherΣ
401515070

Staff

Teacher
Assistant
Technician

Exam schedules

There are no exams scheduled!

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